Protective Instrument Loop Logic Solver records store details about logic solvers for a protective instrument loop. This topic provides an alphabetical list and description of the fields that exist for the Protective Instrument Loop Logic Solver family and appear on the Protective Instrument Loop Logic Solver datasheet. The information in this table reflects the baseline state and behavior of these fields. This list is not comprehensive.
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Field |
Data Type |
Description |
Behavior and Usage |
---|---|---|---|
App Diagnostic Test | Logical | Indicates whether application diagnostic testing is considered for the logic solver. | None |
Approved Custom Device |
Logical |
Indicates whether the logic solver that is identified in the Exida Name field is approved for use in the protective instrument loop. |
This field is disabled and selected if the logic solver has been approved to use via the Validation Failure Rate Reference Data feature. |
Architectural Type |
Character |
Indicates whether the device is a simplex or a complex device. |
If the Manual Entry check box is cleared, this value is disabled and populated with one of the following values based on the device identified in the Exida Name field:
If the Manual Entry check box is selected, this field is enabled. |
Automatic Channel Count | Logical | Indicates whether the number of each type of channel is counted. | If you select this check box, the Channels column in the Channels/Modules pane is populated with the number of channels. |
Automatic Prooftest Switchover | Logical | Indicates whether the logic solver performs proof tests automatically. | If you select this check box, the logic solver performs proof tests automatically. |
Automatic Prooftest Switchover Interval | Number | A numeric value representing the frequency at which proof tests are performed by the logic solver. | This value is measured in months. |
Availability | Number | A number representing the percentage of time between proof tests that the logic solver is expected to be available. |
The GE Digital APM system calculates this value using the following calculation: Availability = (1 - PFD) * 100 |
Calculated PFD Avg | Number | A number representing the probability that the logic solver will fail to react during a demand when the loop is operating in a low demand mode. | This field is disabled. The GE Digital APM system calculates and populates this value. This value depends on the failure rate of the logic solver. |
Calculated PFH | Number | A number representing the probability that the logic solver will fail to react during a demand when the loop is operating in high demand or continuous mode of operation. | This field is disabled. The GE Digital APM system calculates and populates this value. This value depends on the failure rate of the logic solver. |
Calculated STR | Number | A number representing the spurious trip rate for the logic solver. | This field is disabled. The GE Digital APM system calculates and populates this value. |
Common Cause (Beta) | Number | A number representing the percentage of failure that would affect the functioning of multiple devices. For example, a power supply failure for a logic solver that is shared across multiple loops can cause all the loops to fail. In this case, the beta factor is the probability that the loops fail in case of a power supply failure to the logic solver. |
If the value in the Voting field is 1oo1 or 1001D, this value is not applicable. This value is populated automatically when you select a device. |
Description | Character | A brief description of the logic solver. | None |
Device Name | Character | The name of the logic solver device. | This field is disabled and populated when you link or apply a logic solver from Exida's Safety Equipment Reliability Handbook (SERH). |
Diagnostic Test Automatic/Manual | Character | Indicates whether the application diagnostic test is automatic or manual. |
You can select one of the following values:
|
Diagnostic Test Coverage | Number | The percentage of failures that could be detected as part of automatic diagnostic test coverage. | None |
Diagnostic Test Interval | Number | The application diagnostic test interval for the logic solver. | None |
Diagnostic Test Interval UOM | Character | The units for the application diagnostic test interval that you have specified in the Diagnostic Test Interval field. |
You can select one of the following values:
|
Equipment | Character | The ID of the Equipment to which the Protective Instrument Loop Logic Solver is linked. | This field contains a |
Functional Location | Character | The ID of the Functional Location that is linked to the Protective Instrument Loop Logic Solver record. | This field contains a |
HFT | Number | A number representing the hardware fault tolerance, or the number of failures the logic solver can tolerate before failing. | For example, a logic solver with 1oo2 redundancy has a HFT of 1 because it can tolerate one failure and can still continue to operate. |
Logic Solver ID | Character | An ID for the logic solver. | This value is required and is populated with a default value. You can, however, provide a different value. This value must be unique. |
Manual Entry | Logical | Indicates whether you will enter data in a Protective Instrument Loop Logic Solver Channel manually or the GE Digital APM system will populate this values. | If this check box is selected, the
|
MTTFS | Number | A number representing Mean Time To Fail Spuriously for a logic solver. For example, suppose a logic solver senses a hazard that does not exist. In this case, MTTFS is the expected time that the process fails spuriously. | The GE Digital APM system calculates this number automatically and displays it as read-only. This value is measured in years. |
MTTR | Number | A number representing Mean Time To Repair, or the time it takes to repair the logic solver after a failure is detected. | This value is measured in hours. The value that you enter must be between 4 and 336. Otherwise, an error message will appear. This value is required. |
Proof Test Coverage | Number | A number representing the percentage of failures that are detected by the proof test (i.e., how effectively the proof test identifies failures). For example, 100% proof test coverage indicates that the proof test would identify 100% of the failures that could have occurred. | The number that you enter must be between 0 and 100. Otherwise, an error message will appear. This value is required. |
Proof Test Interval | Number | A number representing the monthly intervals at which the proof test should be performed. | The number that you enter must be between 1 and 360, or an error message will appear. This value is required. |
Reference Data Date | Date | The date on which that the reference data was published for the device that is identified in the Exida Name field. |
This field displays the Calendar feature. When the Manual Entry check box is selected, this field is enabled. When the Manual Entry check box is cleared, this value is disabled and populated with the date on which the reference data was published for the device that is identified in the Exida Name field. |
Reference Data Reference | Character | The specific failure data reference as it appears in the Exida data source that is identified in the Reference Data Source field. |
When the Manual Entry check box is selected, this value is enabled. When the Manual Entry check box is cleared, this field is disabled and populated with the data reference for the device that is identified in the Exida Name field. |
Reference Data Revision | Character | A number that represents the number of times the reference data has been revised in the Exida database. |
When the Manual Entry check box is selected, this value is enabled. When the Manual Entry check box is cleared, this field is disabled and populated with the data revision for the device identified in the Exida Name field. |
Reference Data Source | Character | The source of the reference data (e.g., Exida). |
When the Manual Entry check box is selected, this value is enabled. When the Manual Entry check box is cleared, this field is disabled and populated with the data source for the device identified in the Exida Name field. |
SIL Architectural Constraints | Number | A number that represents the SIL value for the logic solver, which is based on the architectural constraints that are defined in the Test Architecture Constraints field. | This field is disabled. The GE Digital APM system calculates and populates this value. |
SIL Systematic Capability | Number | A number that represents the SIL value for the logic solver which is based on the systematic capabilities that are defined in the failure rate data. |
This field is enabled or disabled based on the following criteria:
|
Voting | Character |
The configuration of the logic solver that help achieve the target SIL value. |
This list contains the following options:
This value is populated automatically when you select a device. |
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